This part of IEC 60749 establishes a procedure for measuring the soft error susceptibility ofsemiconductor devices with memory when subjected to energetic particles such as alpharadiation. Two tests are described; an accelerated test using an alpha radiation source and an(unaccelerated) real-time system test where any errors are generated under conditions ofnaturally occurring radiation which can be alpha or other radiation such as neutron. Tocompletely characterize the soft error capability of an integrated circuit with memory, thedevice must be tested for broad high energy spectrum and thermal neutrons using additionaltest methods. This test method may be applied to any type of integrated circuit with memorydevice.